Additional Features:
- I: 1 fA to 100 mA (20 fA offset accuracy)
- V: 1 micro V to 100 V
- Fully automated I-V sweep measurements with DC or Pulse Mode expandable up to 6 SMUs
- Synchronized stress/measure function
- Two high-voltage pulse generator units (+/- 40 V)
- Time domain measurement: 60 micro s — variable intervals up to 10,001 points
- Easy to use knob-sweep similar to curve tracer
- Automatic analysis functions
- Built-in Agilent / HP Instrument BASIC
- Trigger I/Q capability
The Agilent 4155A Semiconductor Parameter Analyzer offers high-resolution/accuracy and a wide range, I: 1 fA to 100 mA (20 fA offset accuracy), V: 1 micro V to 100 V, fully automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs, synchronized stress/measure function, two high-voltage pulse generator units (+/- 40 V), time domain measurement: 60 micro s — variable intervals, up to 10,001 points, easy to use: knob-sweep similar to curve tracer, automatic analysis functions, and automation: built-in HP Instrument BASIC, trigger I/Q capability.
Технические характеристики
| Manufacturer | Agilent, HP, Keysight |
|---|---|
| Condition | Used |
