Description
With its basic ease of use and abundant functions, the XRD-6000 boasts an integrated design featuring a vertical goniometer and data processing software supporting the Windows XP user interface.
The XRD-6000 offers solutions encompassing wide-ranging analysis requirements, from routine qualitative and quantitative analysis to state change analysis, including stress analysis, residual austenite quantitation, crystallite size / lattice strain, crystallinity calculation, materials analysis via overlaid X-ray diffraction patterns, enhanced material evaluation and sample heating analysis. And, of course, crystalline structural analysis is also supported, including precise lattice constant determination and crystal system determination.
