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Microchip (Microsemi) 53100APhase Noise and Allan Deviation Tester, 1 to 200 MHz

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Артикул: 53100A TME арт.: 53100A

The Microsemi 53100A Phase Noise Analyzer measures the amplitude, phase and frequency stability of high-performance RF sources. Carrier frequencies from 1 MHz to 200 MHz are supported. The 53100A tells you everything you need to know about the stability characteristics of your devices, at timescales ranging from femtoseconds to days. From use on a bench-top or embedded into rack-mount ATE systems, the small formfactor and industry-leading measurement speed makes this test set versatile for multiple applications. Thanks to an improved design and advancements in manufacturing, the 53100A offers improvements in reliability and performance over its predecessor technologies.

Технические характеристики