Designed to help you maximize efficiency, Leica DCM8 unites the advantages of High Definition confocal microscopy with interferometry into one versatile, dual-core system. Ultra-fast analysis is ensured thanks to one-click mode selection, sophisticated software and HD confocal scanning without moving parts. Get the Best Accuracy and Repeatability Whether you are working in production or research, the Leica DCM8 delivers the accurate, repeatable metrological analysis results you need in order to optimize material performance. Does your surface have steep slopes or complex shapes? Achieve vertical resolution up to 2 nm withHD confocal microscopy. Is your surface smooth with micro peaks and valleys? Choose from three interferometry modes: Vertical Scanning Interferometry (VSI), Phase Shift Interferometry(PSI) or extended PSI (ePSI) for resolution of up to 0.1 nm. And, if you need a quick, brilliant HD 2D image, the Leica DCM8 offers brightfield and darkfield modes. Capture Surface Data Quickly The Leica DCM8 employs innovative HD microsdisplay scanning technology. With no moving parts in the sensor head, fast and reproducible data capture is guaranteed. The integrated HD CCD camera has a large Field Of View allowing more of your sample surface to be analyzed at once. To obtain a seamless, precise model of an even larger surface area, simply select the ultra-fast XYtopography stitching mode. Acquire Stunning Images By combining outstanding optics with a HD CCD camera, plus red, green, blue and white LED light sources, the Leica DCM8 delivers impressive HD color images. Pulsing the LEDs sequentially allows true color information to be recorded in each pixel.
Технические характеристики
CharacteristicsTypeopto-digitalTechnical applicationsfor analysis, for research, metrology, inspection, for quality control, 3-axis non-contact measuring, for thin-film measurements, multipurpose, for in-line wafer inspection, depth measurementErgonomicsuprightObservation techniquebright field, 3D, confocal, nanoscopeConfigurationbenchtopLight sourceLED illumination, with coaxial illuminationOther characteristicshigh-definition, USB, digital camera, high-resolution, high-contrast, for flat samples, modular, automated, topography, with height ajustment, for nanotechnology, for polished samples, for wafers, movable objective, 3-axis, image-processing, ergonomic, high-speed, with white light interferometry-based metrology system, computerized, high-precision, with profiler function, for integration microscope and profilometer, ultra-high resolution, high-magnification, for semiconductors, real-time, with light intensity manager
