Поставка оптоэлектронных компонентов ведущих мировых производителей

Крепление для образцов Carbon SEM для Cambridge S-4/CamScan

Доставка импортных компонентов по России от 3х недель транспортными компаниями СДЭК, Деловые Линии, Major Express.
Оплата физическими и юридическими лицами безналичным расчетом.
Цена может измениться после запроса у поставщика!
Артикул: GTP16750 TME арт.: GTP16750

Sign up today and we»ll send you a 10% discount code towards your first purchase. Some restrictions apply.

The carbon SEM specimen mounts are ideal for analytical SEM and microprobe work. Mounts are made from spectrographically pure graphite rods. Both electron and X-ray absorption is much higher than compared with aluminium or brass mounts, with lower level background radiation in X-ray spectra and lower level of electron scattering. A cost-efficient alternative are our Carbon Planchets which can be attached to standard aluminium SEM specimen mounts.

Specifications:

  • Mount is 31.7mm diameter
  • Total impurity level does not exceed 2ppm and typically less than 1ppm per element
  • Compatible with Cambridge S-4, CamScan SEMs

Технические характеристики

GTP16750