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Cross line pitch spacing of 463nm with 2160 lines/mm in both directions, cross at 90° for additional accuracy to magnification and aid in distortion checks. Trench-type groove to measure pitch. For electron microscope magnification to 80000/100000.
Cross ruled (waffle), 2160 lines/mm (54864 lines/»), high magnification carbon replica.
Store at room temperature
User note for carbon grating replicas, S003.
Технические характеристики
EMS80050
