Ultra-fast I-V sourcing and measurement have become increasingly important capabilities for many technologies, including compound semiconductors, medium-power devices, nonvolatile memory, microelectromechanical systems (MEMs), nanodevices, solar cells, and CMOS devices. Using pulsed I-V signals to characterize devices rather than DC signals makes it possible to study or reduce the effects of self-heating (joule heating) or to minimize current drift or degradation in measurements due to trapped charge. Transient I-V measurements allow scientists and engineers to capture ultra high-speed current or voltage waveforms in the time domain or to study dynamic test circuits. Pulsed sourcing can be used to stress test a device using an AC signal during reliability cycling or in a multi-level waveform mode to program or erase memory devices. The 4220-PGU High Voltage Pulse Generator unit for the 4200A-SCS supports many of these high-speed sourcing and measurement applications.
Keithley 4220-PGUГенератор высоковольтных импульсов
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