Product Information
These probes can be delivered with three connector options:
PhasorOmniscan™ *Hypertronics™ **
Features :
- Straight beam array contact probe of the B F and MB F probes
- No wedges or delay lines needed
- Permanent, abrasion–resistant wear plate
- Best match to metals
- Higher gain reserve than protective face models
- Ergonomic low profile B F/MB F housing as known from conventional probes for access to tight spaces
- Sector-scan of ± 35° for 2 MHz and ± 25° for 4 MHz version (B F) / ± 45° for 2 MHz for 4 MHz (MB F)
- Near surface flaw detection
- Usable as standard phased array straight beam probe
Applications:
- Multiangle inspection of thick/medium parts
- Plate
- Forgings
- Billets
- Lamination, delamination
- Bond testing
- MB F also usable for pipes , tube, tanks on curved surfaces
* Omniscan™ is a trademark of the Olympus Corporation which has no affiliation with the GE products.
** Hypertronics™ is a trademark of the Hypertronics Corporation which has no affiliation with GE products.
