Product Information
Measures the thickness of ferrous and non-ferrous substrates
- Dual Technology provides automatic recognition of ferrous and non-ferrous substrates
- Magnetic induction for ferrous substrates
- Eddy-current measurement for non-ferrous substrates
- Easy-to use menu system
- Dot matrix LCD display with backlight and contrast
- Memory stores 2500 readings in 50 groups with 50 readings in each group
- Zero-point calibration function
- Complete with two AAA batteries, software, hard case, Steel and Aluminum substrates, and standard films for calibration
For complete specs please download the product datasheet (not available for some accessories)
Specifications Ferrous Probe Non-Ferrous Probe Working Principle Magnetic Induction Eddy Current Measuring Range 0 to 2000µm, 0 to 78.7mils 0 to 2000µm, 0 to 78.7mils Accuracy ±(2%+2µm), ±3.5% (1000 to 2000µm) ±(2%+2µm), ±3.5% (1000 to 2000µm) Resolution 0.1µm (0.01mils) 0.1µm (0.01mils) Minimum Curvature Radius 1.5mm (59.06mils) 3mm (118.1mils) Minimum Diameter 7mm (275.6mils) 5mm (196.9mils) Minimum Thickness 0.5mm (19.69mils) 0.3mm (11.81mils) Dimensions /Weight 4.72.41.25 (120x62x32mm)/6.17oz (175g)
