Additional Features:
- Simultaneous measurements on multiple channels
- Simplifies test of parallel optic devices
- Parallel eye diagram analysis
Simultaneous measurements on multiple channels improves throughput by eliminating the need to sequentially measure individual channels of a parallel optic component, but rather allowing multiple channels to be measured at the same time. For network equipment manufacturers, throughput is improved by allowing multiple devices, or multiple ports on a single device to be tested at the same time.
Технические характеристики
| Manufacturer | Agilent, HP, Keysight |
|---|---|
| Condition | Used |
